HelixRF

HelixRF is a multi-site high-speed probe card wafer test solution for RF Front-End and mmWave applications

HelixRF, utilizing PTSL’s in-house fabricated conductive body, ensures true coaxial paths for the signals through the probe head.

The conductive body achieves low ground inductance and high isolation. HelixRF offers high-end RF performance, while also integrating robustness and field replaceable probes. This innovation offers both improved signal integrity and reliability for rigorous RF test environments.

Capabilities overview:

  • High speed

  • High isolation

  • Low ground inductance

  • Controlled and tunable impedance

  • Field replaceable probes

  • Multi-DUT patterns of rows, columns, diagonal, and small arrays